一序言 x线显徽镜仅仅在最近十年当中才成功地发展起来,在x线学中开辟了一个新的领域。 它迟迟才得到发展的原因在很大程度上系由于x线在所有已知物质中的折射率均近等于1,因此不可能做出短焦距的透镜,因而不可能根据光学显微镜的同样原理来设计制造x线显微镜,但是近来已经研究出一些方法能够放大某种试样的x线相亦即有反射式的x线显微镜和吸收式x线显微镜。 A preface X-ray emblem mirror has only been successfully developed in the last ten years, opening up a new field in x-ray science. The reason for its late development is due in large part to the fact that the refractive index of all known substances in the x-ray is nearly equal to 1, making it impossible to make lenses with short focal lengths and therefore impossible to calculate with the same principle of optical microscopy To design and manufacture x-ray microscopes, some methods have recently been developed that can amplify the x-ray phase of a sample, ie, a reflective x-ray microscope and an absorptive x-ray microscope.