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用阴极充氢方法对1000℃退火Cu、1000℃淬火Cu、600℃淬火Al进行充氢,分别测量了 充氢前后各组样品的寿命谱,用Positronfit程序解谱。结果表明充氢前后,与缺陷浓度相对应的正电子寿命参数I_2随充氢电流密度的增加而有所起伏。
The cathodic charge of hydrogen was used to anneal Cu at 1000 ℃, Cu at 1000 ℃, Al at 600 ℃ for hydrogen enrichment. The lifetimes of samples before and after hydrogenation were measured, and the spectra were resolved by Positronfit program. The results show that the positron lifetime parameter I_2, which corresponds to the defect concentration, fluctuates with the increase of the charge current density before and after hydrogen charging.