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对于 RT,FC、IT 和 SC 等切型来说,所做的第一次旋转和通常情况稍有差别。经第一次稍有差别的旋转后,就得到平行于 X′轴的晶面。对这些晶面和切型作出的四分之一圆图类似于单转角切型的半圆图。为了得到类似于原来切型的温度频率关系,就必须对第二次旋转加以适当的校正。在作出包含 Z 和 X′的截面时,仍可用类似于单转角切型作出包含 Z 和 X 截面时的 X 射线测角法。这些修正的切型所具有的特性,大致和非修正的切型相同。这些切型是比较容易做到的。
For the RT, FC, IT and SC and other types of cut, the first rotation and the usual situation is slightly different. After the first slight difference of rotation, a crystal plane parallel to the X ’axis is obtained. A quarter-circle plot of these facets and cuts is similar to a single-cut, semicircular cut. In order to obtain a temperature-frequency relationship similar to the original cut, the second rotation must be properly corrected. When making a cross-section that includes Z and X ’, X-ray goniometry with Z and X cross sections can still be made in a manner similar to single-corner cuts. The modified cut has the same characteristics as the uncorrected cut. These cut type is relatively easy to do.