电子探针分析微量元素时,背景的精确测定是关键性问题之一。目前采用的测量方法有以下三种;(1)在特征潜线峰位的两侧分别测背景,取其平均值作为测量值。这是分析常量元素通用的方法,但被认为不适于分析微量元素,其理由是连续谱的强度一般不与波长成线性相关;(2)理论计算方法,即根据入射电子的能量、所用谱线的激发能和平均原子序数计算背景强度,但计算 When electron microprobe analysis of trace elements, the background of the accurate determination is one of the key issues. The current measurement methods used are the following three kinds; (1) in the characteristic latent line peak position on both sides of the background were measured, whichever is the average as the measured value. This is a common method of analyzing constant elements, but is considered unsuitable for trace element analysis due to the fact that the intensity of the continuum is generally not linearly related to the wavelength; (2) The theoretical calculation method, which is based on the energy of incident electrons, The excitation energy and average atomic number are calculated for background intensity, but calculated