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运用离子薄化技术成功地制出了浸钒前后氧化球团可供透射电子显微镜观察用的薄膜,并用EM—400电子显微镜对它进行了观察和分析。电子衍射和电子衍衬分析证明了该球团中钒、钠、钙、硅的某些形式化合物的存在(如CaSiO_3、NaVO_3、CaVO_9、Ca_3V_2O_8等)并和X—光衍射分析、化学分析结果作了比较。实验表明:由于上述元素在该球团中含量太低、所形成的物相相对量极少,用X—光衍射或其他方法是难于确定其结构的。
The ion-thinning technique was used to fabricate a thin film of oxidized pellets for TEM observation before and after vanadium precipitation. The films were observed and analyzed by EM-400 electron microscope. Electron diffraction and electron diffraction analysis confirmed the presence of certain forms of compounds (such as CaSiO 3, NaVO 3, CaVO 9, Ca 3 V 2 O 8, etc.) of vanadium, sodium, calcium and silicon in the pellets and X-ray diffraction analysis. The results of chemical analysis A Experiments show that due to the above elements in the pellet content is too low, the formation of a relatively small amount of phase, X-ray diffraction or other methods is difficult to determine its structure.