论文部分内容阅读
Multiple-bit upset (MBU),one of single event effects (SEEs),occurs when single energetic particle in space strikes sensitive regions of high density spaceborne digital microelectronics and produces enough charges which are shared by physically adjacent cells causing more than one
Multiple-bit upset (MBU), one of single event effects (SEEs), occurs when single energetic particle in space strikes sensitive regions of high density spaceborne digital microelectronics and produces sufficient charges which are shared by physically adjacent cells causing more than one