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In this work, we demonstrated that the differential scanning calorimetry (DSC) is not always reliable in measuring thermal stability and grain growth process in nanocrystalline materials by a quantitative analysis and comparison of the DSC data measured in nanocrystalline Ni-P and Hf-Ni samples.
In this work, we demonstrated that the differential scanning calorimetry (DSC) is not always reliable in measuring thermal stability and grain growth process in nanocrystalline materials by a quantitative analysis and comparison of the DSC data measured in nanocrystalline Ni-P and Hf-Ni samples .