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本文采用实验观测的方法，观察了ＴＡＰ晶体的生长外形特征，分析了ＴＡＰ晶体内部结构特征与生长缺陷产生的原因，指出ＴＡＰ晶体生长外形的特征是由晶体内部结构及生长缺陷所决定的。
In this paper, the experimental observation method was used to observe the growth profile of TAP crystals. The internal structure and growth defects of TAP crystals were analyzed. The characteristics of TAP crystals were determined by the internal structure and growth defects of TAP crystals.