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本文研究了真空退火对Nd0.7Sr0.3MnO3(NSMO)外延膜的结构和输运性的影响。X-射线衍射(XRD)和电阻率测量结果显示,随着退火温度的升高,NSMO薄膜单胞沿着c-轴方向拉长,电阻率随退火温度的升高而增大,同时金属-绝缘体转变温度(TP)降低。上述结果归因于真空退火引起的氧缺失导致了Mn3+/Mn4+离子比例的增大及MnO6八面体的畸变。Krger-vink的缺陷反应式定性的解释了氧缺失与输运性的关系.
In this paper, the effects of vacuum annealing on the structure and transport of Nd0.7Sr0.3MnO3 (NSMO) epitaxial films were investigated. The results of X-ray diffraction (XRD) and resistivity measurement show that as the annealing temperature increases, the unit cell of NSMO elongates along the c-axis and the resistivity increases with the increase of annealing temperature. Meanwhile, Insulation transition temperature (TP) decreases. The above results are attributed to the lack of oxygen due to vacuum annealing leading to an increase in the proportion of Mn3 + / Mn4 + ions and the distortion of the MnO6 octahedra. The defect reaction of Krger-vink qualitatively explains the relationship between oxygen deficiency and transport.