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用对向靶反应溅射法制备了α″-Fe1 6 N2 薄膜 ,用 X射线衍射 ( XRD)和振动样品磁强计 ( VSM)对其结构、磁性进行了分析讨论 ,对磁性的分析表明造成饱和磁化强度存在较大差异的原因与其晶胞的大小有很大的关系
The α "-Fe1 6 N2 thin films were prepared by the counter-reactive sputtering method. Their structures and magnetic properties were analyzed and discussed by X-ray diffraction (XRD) and vibrating sample magnetometer (VSM) The reason for the large difference in saturation magnetization has a great relationship with the size of its unit cell