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背景校正在原子吸收光谱分析中是非常重要的,尤其对于石墨炉原子吸收分析。1965年氘弧背景校正器问世,1968年开始商品化,自那以后,大多数原子吸收光谱仪都配备了它。70年代后期,利用塞曼(Zeeman)效应的背景校正器被用于原子吸收光谱仪,但目前仅用在为数不多的仪器上。在1982年的第三十三届匹兹堡分析化学和应用光谱会议上,史密斯—希夫叶(Smith-Hieftje)背景校正法第一次公诸于世,在1983年于阿姆斯特丹举行的第二十三届国际光谱讨论会和第十届原子光谱会议上,H.L.Kahn又再次对其进行描述。本文将介绍这一看起
Background correction is very important in atomic absorption spectroscopy, especially for graphite furnace atomic absorption spectrometry. The Deuterium Arc Background Corrector was introduced in 1965 and commercialized in 1968, and most atomic absorption spectrometers have since been equipped with it. In the late 1970s, background correctors using the Zeeman effect were used in atomic absorption spectrometers, but are currently used on a limited number of instruments. At the 33rd Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy at 1982, the Smith-Hieftje Background Correction Act was first made public at the 23rd Pittsburgh Symposium in 1983 in the 23rd HLKahn described it again at the International Symposium on Spectroscopy and the Tenth Atomic Spectroscopy Conference. This article will introduce this look