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We investigate the characteristics of intensity tuning in a single mode microchip Nd:YAG laser with an exteal cavity. The undulation of laser intensity in a period of λ/2 change of the inteal cavity length is observed.Two different optical feedback cases are performed. One is an exteal cavity reflector perfectly aligned and the other is an exteal cavity reflector tilted. However, the fluctuation frequency of laser intensity in a period of λ/2 change of the inteal cavity length in these two cases is found to be determined by the ratio of exteal cavity length to inteal cavity length. Meanwhile, for the tilted exteal cavity, the fluctuation frequency is also related to multiple feedbacks in the tilted exteal cavity.