提出镀铝锌板耐指纹膜质量的X射线荧光光谱法,对样品的制备条件、仪器工作条件等进行了分析研究,建立了耐指纹膜中元素Cr和Zr的X荧光强度与标准样品膜质量的相关曲线,线性相关系数分别为0.9997和0.9999,相对标准偏差(RSD,n=10)分别为0.69%和0.67%,适用于生产应用。 X-ray fluorescence spectrometry of the fingerprint-proof film quality of aluminized zinc plate was put forward. The preparation conditions of the sample and working conditions of the instrument were analyzed and established. The X-ray fluorescence intensities of the elements Cr and Zr in the fingerprint-resistant film were compared with those of the standard sample The correlation coefficients were 0.9997 and 0.9999, respectively. The relative standard deviations (RSDs, n = 10) were 0.69% and 0.67%, respectively, which were suitable for production applications.