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本文研究了BPT型指形TE-TE和Me-Ar电离室的特性。在由T(d,n)~4He反应产生的混合场中,对电离室的各项修正因子进行了实验测定与计算。TE-TE电离室500 V的饱和修正因子为1.007;Mg-Ar电离室200V的饱和修正因子为1.017。在15MeV中子场中应用双电离室方法测定了葡萄糖和FBX溶液体系(硫酸亚铁—苯甲酸—二甲酚橙)中的吸收剂量。确定了样品中中子吸收剂量与γ射线吸收剂量的比值。并给出了在混合场中中子吸收剂量测量不确定度为±6.3％。
This article studies the characteristics of the BPT-type finger TE-TE and Me-Ar ionization chambers. In the mixed field generated by the reaction of T (d, n) ~ 4He, various correction factors of ionization chamber were experimentally measured and calculated. The saturation correction factor of 500 V for the TE-TE ionization chamber was 1.007 and the saturation correction factor for the 200 V Mg-Ar ionization chamber was 1.017. The absorbed dose in glucose and FBX solution systems (ferrous sulfate-benzoic acid-xylenol orange) was measured in a 15 MeV neutron field using a double ionization chamber method. The ratio of neutron absorbed dose to gamma-absorbed dose in the sample was determined. The measurement uncertainty of neutron absorbed dose in mixed field is given as ± 6.3%.