【摘 要】
：
针对已有单光弹调制器米勒矩阵测量技术缺乏定量误差分析的不足，提出了单光弹调制器米勒矩阵测量误差方程，给出了相对误差分析方法，并结合矩阵条件数得到了降低米勒矩阵各元素最大相对误差的两组1/4波片方位角优化组合。实验结果表明，该两组1/4波片方位角优化组合，测量得到的待测1/4波片米勒矩阵各元素的最大相对误差分别为0.12%和0.20%，相比传统1/4波片方位角优化组合{-90°,-45°,30°,60°}条件下得到的各元素最大相对误差为0.83%，分别降低了85.54%和75.90%。
【机 构】
：
中国科学院上海光学精密机械研究所信息光学与光电技术实验室,上海201800中国科学院大学,北京100049
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针对已有单光弹调制器米勒矩阵测量技术缺乏定量误差分析的不足，提出了单光弹调制器米勒矩阵测量误差方程，给出了相对误差分析方法，并结合矩阵条件数得到了降低米勒矩阵各元素最大相对误差的两组1/4波片方位角优化组合。实验结果表明，该两组1/4波片方位角优化组合，测量得到的待测1/4波片米勒矩阵各元素的最大相对误差分别为0.12%和0.20%，相比传统1/4波片方位角优化组合{-90°,-45°,30°,60°}条件下得到的各元素最大相对误差为0.83%，分别降低了85.54%和75.90%。
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