利用正电子湮没技术对材料内部原子尺度缺陷和损伤十分敏感的特点,设计了一种新的正电子无损检测(Non-destructive testing,NDT)装置,并使用单一样品分析了形变及辐照损伤材料的缺陷状态,证实该测量系统的可行性和可靠性。正电子NDT有望真正从原子尺度上给出材料损伤的判据,比常用的宏观或微观损伤判据更灵敏,可方便、快速及高灵敏探测两维缺陷分布。 Using positron annihilation (ANN), which is very sensitive to atomic scale defects and damage in materials, a new non-destructive testing (NDT) device was designed and a single sample was used to analyze the effects of deformation and radiation damage materials Defective state, confirmed the feasibility and reliability of the measurement system. Positron emission tomography (NDT) is expected to give a true criterion of material damage at the atomic scale. It is more sensitive than the commonly used macroscopic or microscopic damage criterion, and it is convenient, rapid and highly sensitive to detect two-dimensional defect distribution.