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石墨烯具有高导电性、高韧度、高强度、超大比表面积等特点,在电子、航天工业、新能源、新材料等领域有广泛应用。对石墨烯层数测量方法的研究有助于深入理解石墨烯性能与微观结构之间的关系。本文着重阐述了包括光学显微镜、拉曼光谱、原子力显微镜和透射电镜等测量石墨烯层数的方法,同时比较了各种测量方法的优点及局限性,并指出石墨烯层数的测量方法还有待进一步完善。
Graphene has the characteristics of high electrical conductivity, high toughness, high strength and large specific surface area. It is widely used in the fields of electronics, aerospace, new energy and new materials. The study of graphene layer number measurement method will help to understand the relationship between graphene properties and microstructure. This article focuses on the methods of measuring graphene layers including optical microscope, Raman spectroscopy, atomic force microscopy and transmission electron microscopy, and compares the advantages and limitations of various measurement methods. It also points out that the measurement method of graphene layers remains to be determined further improvement.