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为精确测试半导体激光器(LD)的光功率-电流-电压(LIV)特性,提出一种基于脉冲注入调制的方法,并据此研制新型的LD脉冲测试系统.系统通过给被测LD注入脉冲宽度、周期及幅度连续可调的脉冲电流,采集恒功或恒流工作LD的工作电流、两端电压、背光电流和输出光功率等信息,绘制LD的LIV特性曲线,并以此推断LD的性能.采取低占空比的脉冲注入,有效抑制了LD有源区温度升高,保证了测试的可靠性和准确性.实验结果表明,脉冲电流的稳定度达到10-4,系统满足设计要求,其性能优于连续测试系统.
In order to accurately test the optical power-current-voltage (LIV) characteristics of a semiconductor laser (LD), a new method based on pulse injection modulation is proposed, and a new LD pulse test system is developed based on it.The system injects pulse width , Periodic and amplitude continuously adjustable pulse current, constant current or constant current LD working current collection, both ends of the voltage, backlight current and output optical power and other information, draw the LIV characteristic curve of LD, and inferred LD performance The pulse injection with low duty cycle effectively suppresses the temperature rise of LD active region and ensures the reliability and accuracy of the test.The experimental results show that the stability of the pulse current reaches 10-4 and the system meets the design requirements, Its performance is superior to continuous test system.