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锁相热成像是一种应用越来越多的无损检测技术。为了更好的进行锁相红外无损检测,必须全面了解物体内部结构改变对表面相位的影响,更准确地得到锁相红外无损检测各参数设置。本文通过有限元分析方法模拟了锁相加热红外无损检测过程,重点分析了频率对锁相加热红外无损检测的影响,并用法国CED IP红外成像系统进行实验验证,为进一步进行定量化锁相红外无损检测提供借鉴。
Lock-in thermography is an increasing number of nondestructive testing techniques. In order to better perform phase-locked infrared non-destructive testing, it is necessary to fully understand the influence of the change of the internal structure of the object on the surface phase and to obtain the parameters of the phase-locked infrared nondestructive testing more accurately. In this paper, the finite element analysis method is used to simulate the phase-locked heating infrared non-destructive testing process, focusing on the frequency of phase-locked heating infrared nondestructive testing and CED IP infrared imaging system in the United States for experimental verification, in order to further quantify the phase-locked infrared nondestructive Testing to provide reference.