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A novel defected ground structure (DGS) for the microstrip line is proposed in this paper. The DGS lattice has more defect parameters so that it can provide better performance than the conventional dumbbell-shaped DGS. Selectivity is improved by 97.2% with a sharpness factor of 24.6%. The method is applied to the design of a low-pass filter to confirm validity of the proposed DGS.