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利用扫描隧道显微镜研究了采用化学气相沉积法在铜箔表面生长出的高质量的六角氮化硼薄膜.大范围的扫描隧道显微镜图像显示出该薄膜具有原子级平整的表面,而扫描隧道谱则显示,扫描隧道显微镜图像反映出的是该薄膜样品的隧穿势垒空间分布.极低偏压的扫描隧道显微镜图像呈现了氮化硼薄膜表面的六角蜂窝周期性原子排列,而高偏压的扫描隧道显微镜图像则呈现出无序和有序排列区域共存的电子调制图案.该调制图案并非源于氮化硼薄膜和铜箔衬底的面内晶格失配,而极有可能来源于两者界面处的氢、硼和/或氮原子在铜箔表面的吸附所导致的隧穿势垒的局域空间分布.
A high-quality hexagonal boron nitride thin film grown on the surface of copper foil by chemical vapor deposition was investigated by scanning tunneling microscopy. A wide range of scanning tunneling microscopy images showed that the film had an atomically flat surface while the scanning tunneling spectrum Shows that the tunneling microscope image reflects the spatial distribution of the tunneling barrier of the thin film sample.A very low bias scanning tunneling microscope image presents periodic atomic arrangement of hexagonal honeycombs on the surface of the boron nitride film while the highly biased Scanning tunneling microscopy images exhibit an electronically modulated pattern coexisting in a disordered and ordered array region that does not originate from the in-plane lattice mismatch between the boron nitride film and the copper foil substrate but most likely from two The local spatial distribution of tunneling barriers caused by the adsorption of hydrogen, boron and / or nitrogen atoms on the surface of the copper foil at the interface of the copper foil.