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研究了提高X射线衍射强度的方法,将硅漂移探测器(SDD)集成在X射线粉末衍射仪的探测记录系统中,发展出一种新的X射线粉末衍射线的高效探测与记录系统,它包括SDD探测器、单道脉冲分析器和计数电路等部分。测试结果表明,探测记录系统能量分辨率高,可以省去石墨单色器,与常规配备石墨单色器+闪烁/正比探测器的衍射仪相比,衍射强度可提高三到四倍。同时,此探测记录系统可排除样品中荧光元素的干扰,且可用于阵列探测器“阵列”效应失效的测试(如极图、In-Plane分析等)。新系统可提升薄膜材料和凝聚态微纳结构分析的水平。
The method of improving the intensity of X-ray diffraction was studied. By integrating the silicon drift detector (SDD) into the X-ray powder diffraction detector, a new X-ray powder diffraction line detection and recording system was developed. Including SDD detectors, single-channel pulse analyzer and counting circuit and other parts. The test results show that the probe recording system has a high energy resolution and eliminates the need for a graphite monochromator, which can provide three to four times more diffraction intensities than conventional diffractometers equipped with a graphite monochromator + scintillation / proportional detector. At the same time, this detection and recording system can eliminate the interference of fluorescent elements in the sample and can be used for the test of array detector “array ” effect failure (such as polar map, In-Plane analysis, etc.). The new system increases the level of thin-film material and condensed-state micro / nano structure analysis.