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作为检测光学系统和光学元件质量的横向剪切干涉仪是一种值得推广、使用的仪器。近年来,它受到许多光学工作者的重视。但其还存在着波面变形量与干涉条纹变形量不一致,剪切干涉图的判读较为麻烦等问题。本文介绍了一种ZWC—1剪切干涉图,它判读计算程序仅需输入三个基本已知量(剪切宽度、干涉条纹宽度和数量),就可自动定出各参考点的位置,并计算出干涉级次,程序用于计算干涉条纹的变形量和被检测波面的变形量及打印出被检测波面变形量曲线了。文内提供了检测原理的数学模型,较为详细地叙述了如何在已获得的剪切干涉图上确定各参考点的位置及其干涉级次的两种计算方法,例举了程序的使用并给出其程序框图。
As a detection of optical systems and optical components of the transverse shear interferometer is a worthy promotion, use of the instrument. In recent years, it has been valued by many optical workers. However, there are still some problems such as the inconsistency between the amount of wavefront deformation and the interference fringe distortion and the interpretation of the shear interferogram. This article describes a ZWC-1 shear interferogram that interprets the calculation program by simply entering the three basic known quantities (shear width, width and number of interference fringes) to automatically determine the position of each reference point Calculate the interference level, the program used to calculate the amount of deformation of the interference fringes and detected wave surface deformation and print out the waveform of the detected wavefront. The paper provides a mathematical model of the detection principle, describes in detail how to determine the position and the interference level of each reference point on the obtained shear interferogram, and illustrates the use of the program and gives Out of its block diagram.