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本工作采用相对法和以Au为比较器的单一比较铝法分别测定了单晶和多晶硅中的Na、Au、Cu、Sb、Co、As、Cr、Ag等8种元素的含量,两种方法的结果相一致。 1.实验 (1) 硅样品和标准的制备 将单晶(或多晶)硅切割成20×20×5(mm)的方块(重约5～6g),用高纯铝箔封装备辐照。用光谱纯或高纯试剂制成待测元素混合标准溶液。 (2) 比较器的制备 把1μg的Au标准溶液放在石英管中,待蒸干后进行封装。在这种条件下,这些物
In this work, the contents of eight elements, Na, Au, Cu, Sb, Co, As, Cr and Ag, in single crystal and polycrystalline silicon were measured respectively by relative method and single comparison aluminum method with Au as the comparator. Consistent with the results. 1. EXPERIMENTAL (1) Preparation of Silicon Samples and Standards Single-crystal (or polycrystalline) silicon was cut into 20 × 20 × 5 (mm) squares (weighing about 5 to 6 g) and irradiated with a high-purity aluminum foil package. Pure or high purity reagents were used to prepare the mixed standard solution of the elements to be tested. (2) Preparation of Comparator 1 μg of Au standard solution was placed in a quartz tube and allowed to evaporate to dryness before being encapsulated. Under these conditions, these things