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介绍了利用１０道滤波荧光谱仪（简称Ｆ．Ｆ．谱仪）测量新型腔靶中超热电子产生的硬Ｘ光能谱，并结合ＧａＡｓ阵列探测器测量硬Ｘ光角分布，给出了腔外硬Ｘ光总能量，同时用Ｆ．Ｆ．谱仪测量结果与其同方位的ＧａＡｓ探测器测量结果比对，两者在误差范围内是一致的。在Ｆ．Ｆ谱仪和ＧａＡｓ探测器两者数据比较自洽的情况下，并与后向受激拉曼散射光特征量比较，得出了：（１）腔靶内超热电子不是各向同性均匀分布的，大部分超热电子沿着入射激光光轴方向运动；（２）腔内大部分超热电子与冷介质（腔壁）发生库仑作用产生硬Ｘ光。
This paper introduced the measurement of the hard X-ray energy spectrum produced by the superheated electrons in the new cavity target by using 10-channel fluorescence spectrometer (referred to as F.F. spectrometer), and combined with GaAs array detector to measure the hard X-ray angle distribution, Hard X-ray total energy, while using F. F. The results of the spectrometer are compared with those of the GaAs detector with the same orientation, and they are consistent within the error range. At F. F spectrometer and GaAs probe data comparison self-consistent case, and compared with the backward stimulated Raman scattering light features obtained: (1) cavity target hot electron is not uniform isotropic distribution , Most of the superheated electrons move along the optical axis of the incident laser. (2) Coulomb action of most of the superheated electrons in the cavity and the cold medium (cavity wall) produces hard X-rays.