薄样法在X射线荧光光谱分析中应用较为普遍.它的增强、吸收效应很弱,背景低,在很大浓度范围内强度与浓度呈线性关系[1].但是,由于其分析线强度低,分析下限只达千分之几[2],而且分析线强度随膜的厚度而变(厚度效应),所以限制了薄样法的应用范围和它的准确度. 我们研究了薄样散射 X-ray fluorescence spectrometry thin plate method is more common in the application of its enhancement, the absorption effect is weak, the background is low, in a large concentration range of concentration and linear relationship [1] However, because of its low analytical line intensity , The analysis of the lower limit of only a few thousandths [2], and analysis of line intensity changes with the thickness of the film (thickness effect), thus limiting the application of the thin sample method and its accuracy.We studied the thin scattering