针对经过刻蚀的微细矩形磁性体系 ,将样品的形状及其磁晶易磁化轴的偏转两个因素引入经典的Stoner Wohl farth一致转动磁化模型中 ,发现磁性样品的微细化将使其特征星形线发生膨胀 ,而样品形状的缺陷及磁晶易磁化轴的偏转都将导致样品非对称特征星形线的产生 .这些结果说明在诸如磁性随机存储器等基于微细磁性薄膜的工作中 ,薄膜形状及其磁晶易磁化轴的角度不容忽略 . In the case of the etched rectangular magnetic system, two factors, the shape of the sample and the magnetization axis of the magneto-magnetisation, are introduced into the classical Stoner Wohl farth uniform rotation magnetization model. It is found that the miniaturization of the magnetic sample will make its characteristic star Line and the deflection of the magnetizable axis of the magnetite will lead to the generation of asymmetric characteristic star lines of the sample.These results indicate that in the work based on the micro-magnetic thin film such as a magnetic random access memory device, the shape of the film and The magneto-magnetrissal axis angle can not be ignored.