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二次电子发射直接影响法拉第探测器测量质子束流的精度,减小或消除二次电子发射的影响是提高束流测量精度的关键。根据二次电子补偿原理设计了二次电子补偿型同轴法拉第探测器,实验发现探测器测量质子束流强度时不能完全实现二次电子补偿。为改进和完善探测器的设计,从理论上分析了补偿片未能完全消除二次电子对束流测量影响的原因,是由于补偿片前向发射二次电子数目大于收集极后向发射二次电子数目所致。为此设计了质子束穿过金属箔发射二次电子测量装置,测量得到能量为5~10MeV质子穿过10μm厚铜箔时前向与后向发射二次电子产额,验证了理论分析的正确性。
The secondary electron emission directly affects the accuracy of the Faraday detector to measure the proton beam, reducing or eliminating the influence of the secondary electron emission is the key to improve the measurement accuracy of the beam. According to the principle of secondary electron compensation, a secondary electron compensation Coaxial Faraday detector is designed. It is found that the secondary electron compensation can not be fully realized when the detector measures the intensity of proton beam. In order to improve and perfect the design of the detector, the reason why the compensation film can not completely eliminate the influence of the secondary electrons on the measurement of the beam current is theoretically analyzed. The reason is that the number of secondary electrons emitted in the forward direction of the compensation sheet is larger than that of the collector, Electronic number due. For this purpose, a secondary electron measuring device was designed to emit proton beam through the metal foil, and the secondary electron yield of forward and backward emission was measured when energy of 5 ~ 10MeV proton passed through 10μm thick copper foil, which verified the correctness of the theoretical analysis Sex.