A method to control the size of nanoscale silicon grown in thermally annealed hydrogenated amorphous silicon (a-Si : H) films is reported. Using the characteriz
The surface conductivity of poly [2-methoxy-5-(3 -methyl)butoxy]-p-phenylene vinylene (PMOMBOPV) films doped with FeCl3 and H2 SO4 by chemical method and implan