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本文叙述了在9375兆赫及20—700℃温度范围时介质样品的介电常数和损耗正切的测量方法,在直径为0.900时银样品箱(这是利用开槽线)或在圆波导中,对直径为0.900时厚度为λ/4或(3λ)/4的圆形样品进行了测量。这种方法是基于短路线法,并且,考虑到由于样品和箱的膨胀系数的不同会产生隙缝和由于膨胀会引起波导波长的变化。给出了测量误差的影响及氧化铝和氧化铍样品的损耗角正切和介电常数的典型的测量方法。
This paper describes the measurement of dielectric constant and loss tangent of dielectric samples at 9375 MHz and at temperatures in the range of 20-700 ° C. For silver sample pits at 0.900 (using slotted lines) or in circular waveguides A circular sample with a thickness of λ / 4 or (3λ) / 4 at a diameter of 0.900 was measured. This method is based on the short-line method, and considering that due to the difference in the coefficients of expansion of the sample and the case, a slit is generated and the wavelength of the waveguide changes due to the expansion. The effects of measurement errors and typical measurement methods for loss tangent and dielectric constant of alumina and beryllium oxide samples are presented.