论文部分内容阅读
根据工作需要开发了基于PC机、8031单片机的计算辅助测试仪。测试机箱由单片机、高精度任意波形发生器、波形采样器和程控电源等部件组成。测试机箱与PC机间经光电隔离RS232接口传送信息和数据，避免了PC机干扰，机箱使用灵活方便。用C语言开发了测试语言，将DSP数字信号处理技术用于ADC、DAC测试取得了良好效果，已实现14位以下ADC、DAC的自动测试。为实现更高速度、精度的ADC和DAC测试，开发了IEEE488接口板，控制高级智能仪器对其测试。利用美国ESI44PLUS激光修调机硬、软件资源，结合ADC、DAC测试，实现了对12位以下ADC、DAC的动态修调，保证其电气性能指标。
According to the needs of the work developed based on the PC, 8031 single-chip computer-assisted testing instrument. Test chassis by the microcontroller, high-precision arbitrary waveform generator, waveform sampler and program-controlled power and other components. Test the chassis and the PC through the photoelectric isolation RS232 interface to send information and data, to avoid PC interference, the chassis is flexible and convenient. Using C language to develop the test language, DSP digital signal processing technology for ADC, DAC test has achieved good results, has achieved 14 below ADC, DAC automatic test. For faster and more accurate ADC and DAC testing, the IEEE488 interface board was developed to control advanced smart instruments for testing. The use of the United States ESI44PLUS laser repair machine hardware and software resources, combined with ADC, DAC test, to achieve the 12-bit ADC, DAC dynamic trim, to ensure that its electrical performance.