随着闪存(Flash)应用日益广泛,对其失效模式的分析也成为一个重要挑战。本文主要介绍了Flash的基本操作,包括编程、擦除、读操作,并对Flash工作原理作了说明。此外,本文研究了Flash的几种典型常见的失效模式,如擦除中出现的失效、列漏电失效和干扰失效,通过失效原理、失效测试、失效影响等方面对这几种失效模式作了简要分析,其分析方法对Flash的测试有一定的实用价值。 As Flash applications become more widely available, the analysis of their failure modes has also become an important challenge. This article introduces the basic Flash operations, including programming, erasing, reading operations, and describes the working principle of Flash. In addition, this paper studies several typical failure modes of Flash, such as failure in erasing, column leakage failure and interference failure. The failure modes are briefly described in the aspects of failure principle, failure test and failure effect Analysis, the analysis of the Flash test has some practical value.