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高分子材料由于其优异的物理和化学性能应用范围非常广泛,而同步辐射光源的发展大大提高了X射线吸收精细结构(XAFS)技术的使用.本文介绍了XAFS包括扩展X射线吸收精细结构(EXAFS)和X射线吸收近边结构(XANES)的实验原理和实验手段,综述了同行利用XAFS技术在常见高分子、有机金属高分子、钯掺杂高分子、离聚物及碳基材料等高分子领域的结构研究进展,展示了XAFS技术在高分子及其相关材料领域的重要作用和分析方法,体现了XAFS技术的优势和特点,并对XAFS技术在高分子及相关材料方面的应用进行了展望.随着同步辐射技术的发展和提高,XAFS技术在高分子领域的应用将会进一步拓展和提升.
Due to its excellent physical and chemical properties, polymer materials have a wide range of applications, and the development of synchrotron radiation light source greatly enhances the use of X-ray absorption fine structure (XAFS) technology.This paper introduces XAFS including extended X-ray absorption fine structure (EXAFS ) And X-ray absorption near-edge structure (XANES) experimental principle and experimental methods, reviewed by colleagues using XAFS technology in common polymer, organometallic polymer, palladium doped polymer, ionomer and carbon-based materials such as polymers The research progress of structure in the field shows the important function and analysis method of XAFS technology in polymer and its related materials, which shows the advantages and characteristics of XAFS technology. The prospect of XAFS technology in polymer and related materials is also forecasted With the development and improvement of synchrotron radiation technology, the application of XAFS technology in the polymer field will be further expanded and improved.