论文部分内容阅读
针对钨铼合金组成元素的原子序数邻近,成分均匀程度难以表征的特点,采用二次电子图像、背散射电子成分衬度图像观察了钨铼合金的抛光截面形貌;并利用扫描电镜配套的电子探计搭配波谱仪,成功区分了钨铼合金抛光截面的高铼区域与低铼区域,清晰显示了铼元素在铼钨合金中的分布情况。从理论上分析了该方法的可行性,从而为钨铼合金等邻近元素合金成分的均匀性分析提供参考。
In view of the fact that the atomic number of the tungsten-rhenium alloy is close to the atomic number, and the composition uniformity is difficult to characterize, the polish cross-sectional morphology of the tungsten-rhenium alloy is observed by the secondary electron image and the backscattered electron composition contrast image. Probing collocated with the spectrometer, successfully distinguishes the high-rhenium and low-rhenium regions of the tungsten-rhenium alloy polished section and clearly shows the distribution of rhenium in the rhenium-tungsten alloy. The feasibility of this method is theoretically analyzed, which provides a reference for the uniformity analysis of alloy elements such as tungsten-rhenium alloy.