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2012年12月20日,由工业和信息化部电子工业标准化研究院、中国半导体协会、国防科技工业微电子元器件一级计量站主办的“2012微电子与元器件计量测试研讨会”在北京顺利召开。国家质监局计量司宋伟副司长、陈红处长,工业和信息化部科技司韩俊副司长、技术基础处常利民处长,北京市国防
December 20, 2012, by the Ministry of Industry and Information Technology Institute of Electronics Industry Standardization, the China Semiconductor Association, National Defense Science and Technology Industrial Microelectronics components a metering station sponsored "2012 Microelectronics and Components Measurement Test Seminar Successfully held in Beijing. Mr. Song Wei, Deputy Director General of Bureau of Metrology of State Bureau of Quality Supervision, Director Chen Hong, Deputy Director Han Jun of Science and Technology Department of Ministry of Industry and Information Technology, Mr. Chang Limin, Director of Technical Foundation,