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研究了阳离子交换富集预处理/ICP-MS法测定高纯硒中多种杂质,建立了高纯硒中Mg、Al、Ti等13种杂质的分析方法。测定下限达到0.02～0.2μg/g。测定高纯硒样品,相对标准偏差2.5%～22%;加标回收率为80%～110%。
The method of cation exchange enrichment pretreatment / ICP-MS for the determination of various impurities in high-purity selenium was studied. The analytical method of 13 impurities such as Mg, Al and Ti in high-purity selenium was established. The lower limit of determination reached 0.02 ~ 0.2μg / g. Determination of high purity selenium samples, the relative standard deviation of 2.5% to 22%; spike recovery of 80% to 110%.