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2009年11月30日,在北京自动测试技术研究所的泰思特大厦,北京自动测试技术研究所与中国科学院微电子研究所共同成立的“北京集成电路测试技术联合实验室”正式启动。中国科学院北京分院党组副书记杨建国、北京市科学技术研究院院长丁辉、中国科学院微电子所党委书记李培金等领导,以及来自国内微电子领域的有关专家出席了启动仪式。
November 30, 2009, at the Beijing Institute of Automatic Test Technology Building, TEST, Beijing Institute of Automatic Test Technology and Institute of Microelectronics, Chinese Academy of Sciences co-founded the “Beijing Integrated Circuit Testing Technology Joint Laboratory,” was officially launched . Yang Jianguo, deputy party secretary of Chinese Academy of Sciences Beijing Branch, Ding Hui, dean of Beijing Municipal Science and Technology Research Institute, and Li Peijin, party secretary of Chinese Academy of Sciences Institute of Microelectronics, as well as relevant experts from the domestic microelectronics field attended the launching ceremony.