扫描电镜(SEM)可采用反射信息成象(通常是二次电子),故它具有相当大的样品室空间,可以采用各种比较复杂的裝置,如拉伸、压缩、弯曲、加热、冷却等装置对样品进行动态的观察。拉压样品台是动态装置中最重要的一种,可以观察样品在拉压应力状态下表面形态的变化。 Scanning electron microscopy (SEM), which uses reflection information to image (usually secondary electrons), has considerable sample chamber space and allows for the use of more complex devices such as stretching, compressing, bending, heating, cooling, etc. Device for dynamic observation of the sample. Tension and compression sample stage is the most important dynamic device, you can observe the sample under tension and compression stress changes in the surface morphology.