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为了研究激光脉冲串对光电系统的损伤和致盲机理,开展了重频纳秒激光对黑白行间转移相机电荷耦合器件的损伤实验研究。实验结果表明:存在两种积累损伤效应机理,多个脉冲到达CCD靶面同一位置的损伤或致盲具有积累效应,多个脉冲积累损伤能够显著降低线损伤和全靶面损伤阈值,降低程度与脉冲个数、激光到靶能量密度有关。致盲机理与单脉冲致盲机理相同,均表现为器件垂直转移电路间及地间的短路;而激光脉冲串到达CCD靶面的不同位置也能够实现器件的功能性失效,其机制与单脉冲损伤显著不同,仅表现为线损伤的叠加,并未造成器件电路紊乱,功能性损伤阈值即对应线损伤阈值660 mJ/cm~2,而小于单次致盲阈值1 500~2 200 mJ/cm~2。
In order to study the damage and blinding mechanism of the laser pulse train to the photoelectric system, an experimental study on the damage of the charge-coupled device of the transfer camera between black and white by repetitive-frequency nanosecond laser was carried out. The experimental results show that there are two kinds of accumulation damage mechanism. The accumulation or accumulation of multiple impulses arriving at the same position on the CCD target surface has a cumulative effect. Multiple impulsive accumulation injuries can significantly reduce the line damage and total target damage threshold, The number of pulses, laser to target energy density. The mechanism of blinding is the same as that of single-pulse blinding. Both of them show the short circuit between the vertical transfer circuits of the devices and between the ground. The laser pulses reach the different positions of the CCD target to realize the functional failure of the device. The damage was significantly different and only showed the superposition of line damage without causing disorder of the device circuit. The functional damage threshold was 660 mJ / cm ~ 2 corresponding to the line damage threshold and less than 1 500 ~ 2 200 mJ / cm ~ 2.