论文部分内容阅读
IELDVD060:9332:29643-150 0600836 采用算术编码的VLSI试验数据压缩=Compression of VLSI test data by arithmetic coding[会,英]/ Hashempour,H.//Delect and Fauh Tolerance in VLSI Systems,2004.DFT 2004.Proceedings.19th IEEE International Symposium on.-150-157(A) IELDVD060:9332:29643-165 0600837 高级RAID系统用基于XOR的里德-所罗门码算法=
IELDVD060: 9332: 29643-150 0600836 VLSI Test Data Compression with Arithmetic Coding = Compression of VLSI test data by arithmetic coding [English, English] / Hashempour, H. // Delect and Fauh Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on. -150-157 (A) IELDVD060: 9332: 29643-165 0600837 Reed-Solomon Code Algorithm Based on XOR for Advanced RAID Systems =