本文描述了一台低成本数字IC测试设备,它是用Intel—8080微计算机系列来实现的。加到每只待测IC片上的测试码模式从存储在存储器中的表内查取,如果需要,还可有相应的时钟信号。然后检测集成电路的结果输出,看是否有因“粘贴”而引起的错误结果或其它功能上的故障。 本文给出了硬件结构和软件结构,并给出实际系统使用的测试结果。 This article describes a low-cost digital IC test equipment that uses the Intel-8080 Microcomputer Series. The test pattern added to each test IC chip is retrieved from a table stored in memory and, if necessary, also has a corresponding clock signal. The result of the integrated circuit is then tested for output to see if there are any erroneous results or other functional malfunctions due to “pasting.” This paper gives the hardware structure and software structure, and gives the actual system test results.