Defect modes in one-dimensional photonic crystals (PCs) can be readily detected from the solution of the transmission spectra via the standard transfer-matrix method. We adopt an analytic Bloch-mode approach to examine this problem in terms of eigenmode solutions and investigate the dispersion behaviour of localized defect modes supported by a defect layer sandwiched within two symmetric semi-infinite PCs that are made from multiple constituents. The results show that the number of defect modes grows when the dielectric constant and width of the defect layer increase.