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用电感耦合等离子体原子发射光谱法(ICP-AES)测定铬铁中铬磷硅存在的问题是一些高碳铬铁、氮化铬铁等试样难以用酸溶解,在碱熔基体中,大量的易电离元素钠的存在使得测定困难,铬铁中高含量铬和微量的磷、硅等同时测定尤为困难。ICP-AES法同时测定铬铁中铬磷硅是一种新颖的方法。通过试验研究,确定了利用氢氧化钠-过氧化钠混合熔剂熔样的样品处理方法。在用ICP进行测试时,不同谱线所受到的干扰不同。推荐选择Cr 267.716 nm、Cr 206.158 nm、P 213.617 nm、Si 251.611 nm、Si 288.158 nm为分析线;对于干扰,采用基体匹配和两点校正法消除,方法的线性相关系数在0.995以上,磷的测试精密度在5.0%,铬、硅在1.0%以下;铬、硅检出限在0.006%以下,磷为0.002%。准确度试验表明,分析结果与推荐值和手工分析结果间的分析误差在试验允许的误差范围内。
ICP-AES determination of chrome phosphorus silicon in ferrochromium existing problems is that some high-carbon ferrochromium, ferrochromium and other samples difficult to dissolve with acid, in the alkali melt matrix, The presence of a large amount of easily ionized sodium makes the determination difficult, and the simultaneous determination of high contents of chromium and trace amounts of phosphorus and silicon in ferrochrome is particularly difficult. Simultaneous Determination of Chromophosphorus and Silicon in Chromite by ICP-AES Method is a Novel Method. Through the experimental study, the sample processing method using sodium hydroxide - sodium peroxide mixed flux was determined. Different lines experience different interference when tested with ICP. Cr 267.716 nm, Cr 206.158 nm, P 213.617 nm, Si 251.611 nm and Si 288.158 nm are the recommended analytical lines. For the interference, matrix matching and two-point calibration are used to eliminate the linear correlation coefficient of the method above 0.995. The phosphorus test Precision 5.0%, chromium, silicon 1.0% or less; chromium, silicon detection limit of 0.006% or less, phosphorus 0.002%. The accuracy test shows that the analysis error between the analysis result and the recommended value and the manual analysis result is within the allowable error range of the test.