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本文试图弄清高温烘烤所引起的微通道板(MCP)电学特性发生可逆和不可逆变化这一物理现象的本质。发现:在真空烘烤MCP过程中,存在着一个决定MCP电学特性发生可逆或不可逆变化的转变温度。在转变温度以下,MCP的电导主要是表面电导,所观察到的变化仅与除气相关,而该变化在性质上是可逆的;在转变温度以上,MCP的电导是通过体内进行的,其性质主要是离子性导电。可以确信,这种在体内的离子运动相应地引起了MCP的电学性质发生不可逆变化。当低于转变温度时,得到了MCP的传导电流与温度之间的经验公式。并对各种MCP在高温真空烘烤前后的传导电流和电子增益的室温值进行了比较。
This article attempts to understand the nature of the physical phenomenon of reversible and irreversible changes in the electrical characteristics of microchannel plates (MCPs) caused by high temperature baking. It is found that there is a transition temperature that determines the reversible or irreversible change of MCP electrical characteristics during the vacuum baking of MCP. Below the transition temperature, the conductance of the MCP is primarily surface conductance and the observed change is only related to outgassing, and the change is reversible in nature; above the transition temperature, the conductivity of the MCP is passed through the body and its nature Mainly ionic conductive. It is believed that this ionic movement in the body correspondingly causes an irreversible change in the electrical properties of the MCP. When it is lower than the transition temperature, the empirical formula between conduction current and temperature of MCP is obtained. The room-temperature values of conduction current and electronic gain of MCP before and after high-temperature vacuum baking were compared.