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本文针对千分尺检定中的几个技术问题,作些探讨,以求提高认识和理解,从而促使正确检定,保证量值准确一致。一、测砧工作面的正确位置测砧工作面的位置是否正确,关键有两个要素:一是测砧工作面要要垂直于测量轴线;另一个是测砧工作面对称地处于测量轴线上。前一要素可以通过千分尺测砧工作面与测量杆工作面的平行度检定来控制,只要两工作面的平行度好,测砧工作面必然垂直于测量轴线。为了要保证两工作面的平行度好,首先要保证测
In this paper, aiming at some technical problems in micrometer test, some discussions are made in order to raise awareness and understanding so as to promote the correct test and guarantee the accurate and consistent values. First, the correct location of the anvil face Anvil face position is correct, the key there are two elements: First, the anvil face to be perpendicular to the measurement axis; the other is the anvil face symmetrically in the measurement axis on. The previous element can be controlled by the parallelism of the micrometer anvil face and the measuring face, as long as the parallelism of the two faces is good, the anvil face must be perpendicular to the measurement axis. In order to ensure the parallelism of the two faces is good, we must first ensure that the test