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在某些实验中,由于样品来源的有限性,导致样品数量有限,因而有必要探讨少量样品中主次元素的测定方法。X射线荧光光谱法具有样品制备简单、分析速度快、重现性好、测量范围宽和多元素同时进行分析的特点,目前在众多领域中得到了广泛的应用。基于回归曲线法、经验系数法和康普顿散射线内标法求取了各待测元素的工作曲线常数、元素间效应的影响系数和谱重叠系数,并对4g(32mm内径,常规)和1g(10mm内径,少量)样品测量的精密度和准确度进行了比较分析。结果表明,4g(32mm内径,常规)样品测量平均精密度约为1%,1g(10mm内径,少量)样品的平均精密度约为3%。测定结果基本能够满足覆盖区多目标地球化学调查样品的质量要求。
In some experiments, due to the limited source of samples, the sample number is limited, so it is necessary to explore the determination of primary and secondary elements in a small amount of samples. X-ray fluorescence spectrometry has the advantages of simple sample preparation, fast analysis, good reproducibility, wide measuring range and simultaneous analysis of multiple elements. At present, it has been widely used in many fields. Based on the regression curve method, empirical coefficient method and Compton scattering internal standard method, the working curve constants, the influence coefficients of the inter-element effects and the spectral overlap coefficients of each element under test were obtained. 1g (10mm ID, a small amount) sample precision and accuracy of the comparative analysis. The results showed that the average precision of 4g (32mm ID, conventional) samples was about 1%, and the average precision of 1g (10mm ID, a few samples) was about 3%. The results can basically meet the quality requirements of multi-objective geochemical survey samples in the coverage area.