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本文介绍用于超钚元素分离流程的高灵敏度监测装置和定量分析技术。采用NaI(Tl)薄晶体双探头相加谱仪测定X射线和低能γ射线。采用Si(Au)面垒半导体流线监测器测定厚源α谱。描述了监测器的结构和电子仪器。对厚源α谱特性的研究结果和定量刻度方法。给出了用于离子交换色层法提取~(243)Am和~(244)Gm流程所得的实验结果。NaI(Tl)薄晶体双探头系统对~(243)Am总加入量的灵敏度好于0.1微居。Si(Au)面垒监测器对镅、锔浓度测定精度为±5%。各收集容器内镅、锔含量的精度为±10%。
This article describes high-sensitivity monitoring devices and quantitative analysis techniques for the ultra-plutonium elemental separation process. X-ray and low-energy γ-rays were measured using NaI (Tl) thin-shell dual-probe addition spectrometer. Determination of Thick Source α - Spectrum Using Si (Au) Barrier Semiconductor Flowline Monitor. Describes the structure of the monitor and the electronics. The research results and quantitative calibration method of α spectrum of thick source. The experimental results for the extraction of ~ (243) Am and ~ (244) Gm by ion exchange chromatography were given. The sensitivity of NaI (Tl) thin-crystal dual-probe system to the total amount of ~ (243) Am is better than 0.1. Si (Au) surface barrier monitor 镅, 锔 concentration determination accuracy of ± 5%. Each collection container 镅, 锔 content accuracy of ± 10%.