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电荷耦合器件(CCD)辐射效应测试系统需具备通用性。通常情况下需要为每一种CCD设计一款测试电路,无法满足通用性要求,通用性电路的难点在于不同CCD要求不同的驱动通道数、驱动时序、信号占空比及工作点。提出了一种适用于多种CCD的测试电路设计方法。以现场可编程门阵列(FPGA)负责时序发生、工作点调节及整个系统的控制,驱动模块采用工作点可调的模式,并结合电荷泵技术,仅需更改FPGA设计及给驱动模块提供不同的工作点电压,便可使以上驱动参数可调,实现测试电路的通用性。采用该方法进行测试还可以适应CCD辐照后工作点的变化。最后通过正确驱动TCD1209线阵CCD和4096×96型TDI-CCD,并对TDI-CCD总剂量辐照实验进行正确的参数测试,验证了通用测试电路设计方法的可行性。
Charge Coupled Device (CCD) radiation effects test system needs to be versatile. Under normal circumstances, it is necessary to design a test circuit for each type of CCD, which can not meet the requirement of universality. The difficulty of the universal circuit lies in that different CCDs require different numbers of driving channels, driving timings, signal duty cycles and operating points. A test circuit design method suitable for a variety of CCDs is proposed. The field programmable gate array (FPGA) is responsible for timing, operating point adjustment and control of the entire system, the drive module with adjustable operating point mode, combined with charge pump technology, simply change the FPGA design and to provide different drive module Working point voltage, can make the above driving parameters adjustable, to achieve the versatility of the test circuit. Using this method to test can also adapt to changes in CCD operating point after irradiation. Finally, by correctly driving the TCD1209 linear CCD and the 4096 × 96 TDI-CCD, the correct parameters of the TDI-CCD total dose irradiation experiment were tested, and the feasibility of the universal test circuit design method was verified.