论文部分内容阅读
本文概述用于评定电子系统电磁干扰的辐射发射及敏感性的测量方法、本文评述了常规的吸波暗室及屏蔽室的测量方法,以及为解决常规屏蔽室中进行辐射特性测量的一些问题而发展起来的其他方法,其中包括带罩天线、波型扰动、统计取样、横向电磁波(TEM)室,以及平行板、低 Q 室,长线天线等技术。并对各种技术的优缺点也作了定性比较。
This article provides an overview of methods for measuring radiative emission and susceptibility to electromagnetic interference in electronic systems. This article reviews conventional methods for measuring anechoic chambers and shielded rooms and addresses some of the issues in measuring radiative properties in conventional shielded rooms Other methods, including shrouded antennas, wave perturbations, statistical sampling, transverse electromagnetic (TEM) chambers, and parallel plates, low Q-chambers and long-wire antennas are among other techniques. The advantages and disadvantages of various technologies have also been qualitatively compared.