前言用金相显微镜只能观察到材料中的晶界,无法观察晶粒内部的嵌块结构,也无法估计由于晶格畸变引起的二类应力。应用透射电子显微镜技术虽然可以观察到嵌块结构,但有些材料制样相当困难。用 X 光衍射线形分析的方法来测量材料中的二类应力和嵌块尺寸是目前广泛采用的有效方法。 Foreword Metallurgical microscope can only observe the grain boundaries in the material, can not observe the structure of the embedded in the grain, and can not estimate the second type of stress caused by the lattice distortion. Although transmission electron microscopy can be used to observe the structure of the slug, some materials are rather difficult to sample. It is a widely used and effective method to measure the second type of stress and the size of the block in the material by the method of X-ray diffraction linear analysis.